Project: Metrology for the manufacturing of thin films

Thin film materials possess novel properties not found in bulk materials, enabling their use in the production of flexible LCDs or solar panels that can be fixed to the outside of windows. The production of thin films was previously limited by a lack of understanding of precisely how changes in the composition and structure of thin film materials affect properties such as electronic and thermal conductivity. This project established the validation and traceability of measurements of thin films properties and developed new methods and advanced reference materials to support thin film manufacturing quality control. Aligned with reduced costs and time-to-market of new products, these results will help to maintain European leadership in the multi-billion Euro worldwide sector of thin film optoelectronics.

Acronym	IND07 Thin Films (Reference Number: IND07)
Duration	01/08/2011 - 31/07/2014
Project Topic	Metrology
Project Results (after finalisation)	See Website
Website	visit project website
Network	EMRP
Call	EMRP Call 2010 - Industry and Environment

Project partner

Number	Name	Role	Country
1	NPL Management Limited	Coordinator	United Kingdom
2	Aalto-korkeakoulusäätiö	Partner	Finland
3	Bundesanstalt fuer Materialforschung und -pruefung	Partner	Germany
4	Commissariat à l'énergie atomique et aux énergies alternatives	Partner	France
5	Cesky Metrologicky Institut	Partner	Czech Republic
6	Laboratoire national de métrologie et d'essais	Partner	France
7	Physikalisch-Technische Bundesanstalt	Partner	Germany
8	VSL B.V.	Partner	Netherlands
9	Inmetro Instituto Nacional de Metrologia, Qualidade e Tecnologia	Observer	Brazil
10	PANalytical B.V.	Observer	Netherlands
11	Solarprint Limited	Observer	Ireland
12	TOTAL S.A.	Observer	France
13	Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.		Germany
14	Helmholtz-Zentrum Berlin für Materialien und Energie GmbH		Germany
15	Imperial College of Science, Technology and Medicine		United Kingdom