Project: Metrology for the manufacturing of thin films
Thin film materials possess novel properties not found in bulk materials, enabling their use in the production of flexible LCDs or solar panels that can be fixed to the outside of windows. The production of thin films was previously limited by a lack of understanding of precisely how changes in the composition and structure of thin film materials affect properties such as electronic and thermal conductivity. This project established the validation and traceability of measurements of thin films properties and developed new methods and advanced reference materials to support thin film manufacturing quality control. Aligned with reduced costs and time-to-market of new products, these results will help to maintain European leadership in the multi-billion Euro worldwide sector of thin film optoelectronics.
| Acronym | IND07 Thin Films (Reference Number: IND07) |
| Duration | 01/08/2011 - 31/07/2014 |
| Project Topic | Metrology |
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Project Results (after finalisation) |
See Website |
| Website | visit project website |
| Network | EMRP |
| Call | EMRP Call 2010 - Industry and Environment |