Project: Metrology for the manufacturing of thin films

Thin film materials possess novel properties not found in bulk materials, enabling their use in the production of flexible LCDs or solar panels that can be fixed to the outside of windows. The production of thin films was previously limited by a lack of understanding of precisely how changes in the composition and structure of thin film materials affect properties such as electronic and thermal conductivity. This project established the validation and traceability of measurements of thin films properties and developed new methods and advanced reference materials to support thin film manufacturing quality control. Aligned with reduced costs and time-to-market of new products, these results will help to maintain European leadership in the multi-billion Euro worldwide sector of thin film optoelectronics.

Acronym IND07 Thin Films (Reference Number: IND07)
Duration 01/08/2011 - 31/07/2014
Project Topic Metrology
Project Results
(after finalisation)
See Website
Website visit project website
Network EMRP
Call EMRP Call 2010 - Industry and Environment

Project partner

Number Name Role Country
1 NPL Management Limited Coordinator United Kingdom
2 Aalto-korkeakoulusäätiö Partner Finland
3 Bundesanstalt fuer Materialforschung und -pruefung Partner Germany
4 Commissariat à l'énergie atomique et aux énergies alternatives Partner France
5 Cesky Metrologicky Institut Partner Czech Republic
6 Laboratoire national de métrologie et d'essais Partner France
7 Physikalisch-Technische Bundesanstalt Partner Germany
8 VSL B.V. Partner Netherlands
9 Inmetro Instituto Nacional de Metrologia, Qualidade e Tecnologia Observer Brazil
10 PANalytical B.V. Observer Netherlands
11 Solarprint Limited Observer Ireland
12 TOTAL S.A. Observer France
13 Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. Germany
14 Helmholtz-Zentrum Berlin für Materialien und Energie GmbH Germany
15 Imperial College of Science, Technology and Medicine United Kingdom