Project: A novel portable X-ray diffractometer for nano-structures characterization

The CO objective is to combine X-Ray Diffraction (XRD) method with new X-ray detector technology and system design in a novel portable system for continuous on-line nano-structure characterization (quality control) in the production line of nanotechnology based products, and efficient material analysis out in the field._x000D__x000D_X-ray diffraction (XRD) is a technique which allows analysis of the atomic structure and the determination of the arrangement of atoms within a crystal, and is commonly used in the industry and in many laboratories for characterizing new materials. An X-ray diffraction (XRD) system transmits X-ray beams to a sample (generally a single crystal, metallic solid or a powder) and records the diffraction pattern that occurs when the X-ray photons encounter the inter-atomic gaps within the crystal structure. Applications for XRD are widespread in areas such as pharmacy, mining, electronic, forensic, nano-developments, cosmetic, environment, art, metallurgy and more. The apparatus used for XRD analysis is called a diffractometer and consists of a X-ray source, a sample holder and a detection device._x000D__x000D_This new system (DynamiX) will be designed to take advantage of the unique features of Interons highly advanced photon counting solid-state detector technology combined with the experience and capabilities of INEL to optimize a new XRD spectrometer based on the new detector. This will extend the usability for XRD in the marketplace, and significantly increase the market for such instruments, for the CO reasons of:_x000D__x000D_• Significantly increased portability_x000D_• Reduced but optimized versatility (leading to lower price and operation by non-experts)_x000D_• Its capability to perform continuous on-line nano-structure quality control on fabrication lines._x000D__x000D_In order to achieve the CO goal of this project, pronounced sub-goals are:_x000D__x000D_• Thorough optimization of the specifications of the new system to match our commercial ambitions._x000D_• Development of a silicon-sensor that meets the system specifications._x000D_• Development of a optimized multi-pixel integrated circuit read-out chip (ASIC)._x000D_• Integrate the silicon-sensor with the ASICs to form the new X-ray detector._x000D_• Development of low-weight X-ray source with optimized optics._x000D_• Software capable to perform data collection and data treatment._x000D_• Mechanical design and system integration of the X-ray source and the detector into the final X-ray diffractometer system._x000D_• System testing, validation and documentation._x000D__x000D_The project consortium consist of INEL SAS (France), Interon AS (Norway) and SINTEF (Norway)._x000D__x000D_INEL will be the project coordinator and will be responsible for the overall system development and the system integration. INEL is an experienced developer, manufacturer and sales organization of other systems for XRD and has a well recognized position in this marketplace._x000D__x000D_Interon will be the other major participant in this project and will be responsible for the development of the feature enabling new X-ray detector. Interon is a company recognized for its cutting-edge new technologies within X-ray detection technology who very recently, together with General Electric, co-developed a revolutionary new prototype for for clinical-CT, based on the photon-counting technology of the same kind that will be used in this project._x000D__x000D_SINTEF is the largest independent research organization in Scandinavia. The organization provides research-based knowledge and related services to customers in industry, venture companies and the public sector world wide. Their technology for X-ray sensitive silicon-sensor development and manufacturing is world-wide recognized and their participation in this project will contribute this very important silicon-sensor component (of the detector) to this project._x000D_In addition to the targeted CO application for this new X-ray diffractometer, the system will also introduce new advantages for a broad range of other existing and new applications such as e.g. portable tool for forensic analysis in discovery of explosives and narcotics (several other examples are listed in chapter 2.4.3)._x000D_ _x000D_We strongly believe that the particular new features of this system will open a new market for usage of XRD methology, and that this new market could be larger than the current world-wide XRD annual market of around €180 millions. The commercial ambitions of this project is to explore both the current market and the new potential market enabling INEL to win a large market share.

Acronym DynamiX (Reference Number: 5542)
Duration 01/06/2010 - 30/11/2012
Project Topic The CO objective is to combine X-Ray Diffraction (XRD) method with new X-ray detector technology and system design in a novel portable system for continuous on-line quality control in the production line of nanotechnology based products, and efficient material analysis out in the field.
Project Results
(after finalisation)
the solid detector was done and Inel did the reading system using FPGA components
Network Eurostars
Call Eurostars Cut-Off 4

Project partner

Number Name Role Country
3 INEL Coordinator France
3 Stiftelsen SINTEF Partner Norway
3 Interon AS Partner Norway