Project: Traceable characterisation of nanostructured devices

A revolution is occurring in the world of micro- and nano-electronics in terms of miniaturisation, power consumption and processing speed. New types of inorganic materials are being used in semiconductor materials, where silicon has always dominated, new 3D architectures are being employed in chip design and new electronics based on organic semiconductors are emerging. The techniques used in the semiconductor industry need to be updated to ensure that they apply to these new technologies. This project will support this by developing and improving the methods for characterising the chemical and electrical properties of nanostructures. No single technique can provide the traceability required, therefore this project will make accurate comparisons between a range of different techniques. By ensuring accurate measurement and reliable characterisation of material and device properties, this project will support the competitiveness of the European semiconductor industry

Acronym NEW01 TReND (Reference Number: NEW01)
Duration 01/07/2012 - 30/06/2015
Project Topic Metrology
Project Results
(after finalisation)
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Network EMRP
Call EMRP Call 2011 - Health, SI Broader Scope and New Technologies

Project partner

Number Name Role Country
1 NPL Management Limited Coordinator United Kingdom
2 Bundesanstalt fuer Materialforschung und -pruefung Partner Germany
3 Commissariat à l'énergie atomique et aux énergies alternatives Partner France
4 Cesky Metrologicky Institut Partner Czech Republic
5 Istituto Nazionale di Ricerca Metrologica Partner Italy
6 Physikalisch-Technische Bundesanstalt Partner Germany
7 ION-TOF Technologies GmbH Observer Germany
8 Commissariat à l'énergie atomique et aux énergies alternatives France
9 Interuniversitair Micro-Electronicacentrum IMEC VZW Belgium