Project: Traceability of sub-nm length measurements

Although an error of less than one nanometre (or one billionth of a metre) may seem small enough to be inconsequential, there are already many important applications in metrology and industry that require uncertainties at this level. Such high accuracy measurements are usually made with a device called an optical interferometer, which uses the relationship between the wavelength, frequency and speed of light to calculate a length. Capacitive sensors, in which the distance between two electrodes is calculated from the permittivity of the medium between them and the capacitance, or ability to hold charge, can also be used. Although these devices rely heavily on calibration to remain accurate over time. This project aims to improve the traceability of high accuracy measurement devices used in National Metrology Institutes, nanomedicine, high-tech industries such as the semiconductor and nanopositioning industries, and the space industry, where calibrations need to be valid for the lifetime of the instrument.

Acronym SIB08 subnano (Reference Number: SIB08)
Duration 01/07/2012 - 30/06/2015
Project Topic Metrology
Project Results
(after finalisation)
See Website
Website visit project website
Network EMRP
Call EMRP Call 2011 - Health, SI Broader Scope and New Technologies

Project partner

Number Name Role Country
1 Physikalisch-Technische Bundesanstalt Coordinator Germany
2 Cesky Metrologicky Institut Partner Czech Republic
3 Teknologian tutkimuskeskus VTT Oy Partner Finland
4 NPL Management Limited Partner United Kingdom
5 Turkiye Bilimsel ve Teknolojik Arastirma Kurumu Partner Türkiye
6 VSL B.V. Partner Netherlands
7 Istituto Nazionale di Ricerca Metrologica Observer Italy
8 Technische Universiteit Delft Netherlands
9 Università degli Studi di Torino Italy