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Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing

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EMPIR
EMPIR Call 2020
Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing
JCMwave GmbH

Full name	JCMwave GmbH
Short name	JCM
Type of organisation	Private - large company
Partner Role	Partner
Country	Germany

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Funded by the European Union under the Grant Agreement no. 101102316. Views and opinions expressed are those of the author(s) only and do not necessarily reflect those of the European Union or the European Commission. Neither the European Union nor the granting authority can be held responsible for them.

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